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Created with Raphaël 2.1.0 17.03.2006 Formal examination (assignment of filing date) 30.03.2006 Preliminary examination 27.07.2006 Substantive examination 28.02.2007 Publication of the decision of grant (F1) 31.08.2007 Completion of the opposition filing period 30.09.2007 Issuance of patent (G2) 17.03.2011 Valid until 30.09.2012 Publication of the decision of forfeiture, the term of re-establishment has expired

Patent lapsed


(11)Number of the document3257
(21)Number of the applicationa 2006 0083
(22)Filing date of the application2006.03.17
 Date of filing the request for examination (de fond) 02.06.2006
(71)Name(s) of applicant(s), code of the countryFIRMA DE PRODUCTIE SI COMERT "DISCRET ELEMENT" SRL, MD;
(72)Name(s) of inventor(s), code of the countryBARANOV Simion, MD; CINIC Boris, MD; REDWING Joan, US;
(73)Name(s) of owner(s), code of the countryFIRMA DE PRODUCTIE SI COMERT "DISCRET ELEMENT" SRL, MD;
(54)Title of the inventionProcess for gallium and arsenic recovery from waste formed after epitaxial growth of semiconductor layers of the type A3B5
(13)Kind-of-document code
G2, BOPI 10/2007
F1, BOPI 02/2007
(51)International Patent Classification C22B 5/02 (2006.01); C22B 5/10 (2006.01); C22B 5/12 (2006.01); C22B 5/16 (2006.01); C22B 30/04 (2006.01); C22B 58/00 (2006.01); B09B 3/00 (2006.01);
(19)CountryMD
(45)Date of publication of patent granting decision:2007.02.28
(47)Date of issuance of patent2007.10.31
 Substantive examiner(s)CIOCÂRLAN Alexandru
 Payment for maintenance up to the date2011.03.17
 Date of patent termination2011.03.17
 Date of publication of the termination of patent, with the right of restoration2011.10.31
 Date of publication of the termination of patent, without the right of restoration2012.09.30
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